发明名称 Semiconductor composite element, and method of detecting abnormal conditions in an inverter device having the element
摘要 A semiconductor composite element in which abnormal conditions of overcurrent, control supply voltage reduction and overheat are detected, and different abnormality signals are outputted according to the respective abnormal conditions thus detected. The semiconductor composite element includes: abnormal condition detecting circuitry for detecting the overcurrent and control supply voltage reduction of any one or all of the plurality of semiconductor switching elements and the overheat of the semiconductor composite element. An abnormality signal generating circuit is provided for producing different abnormality signals according to the respective abnormal conditions detected by the abnormal condition detecting circuitry.
申请公布号 US5869996(A) 申请公布日期 1999.02.09
申请号 US19960769183 申请日期 1996.12.18
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 OKUMURA, NORIHIKO
分类号 G01R19/165;H02H7/122;H02M1/00;H02M1/32;(IPC1-7):H01L35/00 主分类号 G01R19/165
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