发明名称 PROBE, METHOD OF ITS MANUFACTURING, AND PROBE-TYPE MEMORY
摘要 <p>A probe comprising a core (2) having a 1st end part (2a) in which light from a light source is incident and a 2nd end part (2b) with a diameter smaller than the wavelength of the incident light and a cladding (1) covering the core (2). A thin nitride film (3) made of at least one nitride among titanium nitride, zirconium nitride and hafnium nitride is formed on the surface of the core (2) on the 2nd end part (2b) side except the 1st and 2nd end parts (2a) and (2b). The thin nitride film (3) has a high reflectivity for a light with a wavelength of longer than 600 nm and the incident light does not leak out of the probe and reaches the tip of the probe, so that the intensity of the light emitted from the tip of the probe is improved. When the probe is used in a probe-type memory, high density recording with an excellent signal quality (S/N) can be realized.</p>
申请公布号 WO1999005530(P1) 申请公布日期 1999.02.04
申请号 JP1998003171 申请日期 1998.07.15
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