Method of detecting element in sample

摘要

The method uses an transmission electron microscope to measure a first image of an intensity (I1p) at an energy loss before the edge of the element. A second image is then formed of the intensities (I2p) of the sample at an energy loss in the range of the element edge. A second sample which does not contain the element intensity is used as a comparator. An approximation function is calculated and an image of the pure element specific intensities (Ie) can be calculated , by calculating, for each point of the first image the corresponding intensity using the approximation function.