发明名称 DISPLAY SYSTEM FOR RICE QUALITY EVALUATING DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To easily compare the quality measured data before and after rice milling by compiling and concurrently displaying the quality measured result of unpolished rice and the quality measured result of polished rice on a screen. SOLUTION: Sample unpolished rice is divided into a measuring path 13 and a milling path 14 from a hopper 11 by a distributing device 12. The sample unpolished rice on the measuring path 13 is divided into an external appearance quality measuring means 16 and an internal quality measuring means 17 by a distributing device 15, and the quality measured data are displayed on a display means 31 and stored in a memory means 30. The sample unpolished rice on the milling path 14 is measured for its initial weight by a meter 21 through a measuring path 20, it is milled by a milling means 18, it is measured by the meter 21 to find the milling yield, and it is again milled by the milling means 18 when the milling yield is a target value or below. The sample unpolished rice with the milling yield of the target value or above is fed to the measuring path 13 from a conveying path 28, the quality is measured by the external appearance quality measuring means 16 and the internal quality measuring means 17, and the measured data are displayed on the display means 3 1 and stored in the memory means 30. The quality measured data of unpolished rice and polished rice can be easily compared.</p>
申请公布号 JPH1123560(A) 申请公布日期 1999.01.29
申请号 JP19970172669 申请日期 1997.06.30
申请人 SEIBUTSUKEI TOKUTEI SANGYO GIJUTSU KENKYU SUISHIN KIKO;ISEKI & CO LTD;KETT ELECTRIC LAB;SHIZUOKA SEIKI CO LTD;KUBOTA CORP 发明人 SUGIYAMA TAKAO;MAKINO EIJI;ICHIKAWA TOMOHIKO;FUJIOKA SADAKAZU;MORI TAIICHI;EMORI MOTOHIKO;WATANABE TOSHIMICHI;WARASHINA JIRO;KAWANAKA MICHIO;SHIMIZU AKIYOSHI;MATSUSHITA KAZUKI
分类号 G01N21/85;G01N21/35;G01N21/359;G01N33/10;(IPC1-7):G01N33/10 主分类号 G01N21/85
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