| 摘要 |
<p>Improving accuracy of frequency response measurements of linear systems using modulation optical function test compensation. An optical imaging system (145) illuminates and images an input test pattern (143). A processor (84) measures a modulation transfer function. The processor (143) determines a compensating factor for error in the input test pattern duty cycle. The driving function for the measurement is a test pattern (143) having a periodic waveform approximating a square wave with an error in duty cycle. A windowed fast fourier transform on a greyscale image of the test pattern (143) generates odd harmonics corrects for the error in resolution target duty cycle.</p> |
