发明名称 MICRO-OBJECT ANALYZING APPARATUS, AND ADJUSTING APPARATUS FOR MICRO-OBJECT DETECTING MEANS USED IN THE MICRO-OBJECT ANALYZING APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To simply analyze a micro-object on a sample in a short time. SOLUTION: A micro-object analyzing apparatus 1 comprises an XY stage 3, an optical unit 4, a scanning electron gun 5, an X-ray detector 6, and a secondary electronic detector 7 which are stored in a vacuum container 1a. A laser module 10 including at least a laser light source and an optical system, and a photodetector 12 detecting a scattering light from a sample are mounted to a main body stage 11, thereby constituting the optical unit 4. The optical unit is detachably set to the vacuum container 1a.</p>
申请公布号 JPH1123481(A) 申请公布日期 1999.01.29
申请号 JP19970172197 申请日期 1997.06.27
申请人 ADVANTEST CORP 发明人 KANO EIJI
分类号 G01N23/225;G01N21/88;G01N21/94;G01N21/956;G01N37/00;G01Q30/02;G01Q60/24;H01L21/66;(IPC1-7):G01N21/88 主分类号 G01N23/225
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