发明名称 Process for fabricating SOI substrate
摘要 The present invention provides a process for fabricating an SOI substrate with no peripheral scratches and with enhanced fabrication efficiency. The present process includes bonding a semiconductor wafer of an active substrate 1 and a semiconductor base wafer 2 to form a bonded wafer 4; surface-grinding the active substrate 1; spin etching the surface-ground active substrate 1; and PACE processing the etched active substrate 1 to form the active substrate into a thin film and simultaneously, to remove the non-bonded peripheral portion of the bonded wafer 4.
申请公布号 US5863829(A) 申请公布日期 1999.01.26
申请号 US19960748406 申请日期 1996.11.13
申请人 KOMATSU ELECTRONIC METALS CO., LTD. 发明人 NAKAYOSHI, YUICHI;YAMAMOTO, HIROAKI;ISHII, AKIHIRO
分类号 H01L21/306;H01L21/02;H01L21/20;H01L21/304;H01L21/336;H01L27/12;H01L29/786;(IPC1-7):H01L21/302 主分类号 H01L21/306
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