| 摘要 |
An X-ray microscope having an incident X-ray beam (10) from an X-ray source, a first crystal element (14) extending at an angle ( beta ) across the path of the incident X-ray beam (10), a second crystal element (16) extending parallel to the first crystal element (14) and in spaced relationship (22) thereto, a sample (20) in spaced relationship to the second crystal element (16) and downstream thereof relative to the incident X-ray beam, the first and second crystal elements being movable relative to each other and to the incident X-ray beam so that the orientation of atoms in the second crystal element do not match the orientation of atoms in the first crystal element to thereby produce a forward incident X-ray beam (26) in the direction of the original beam (10) and a diffracted X-ray beam (28) at an angle relative to the incident X-ray beam, the forward and diffracted beams being directed onto the sample (20), a forward beam detector (12) for receiving the forward X-ray beam and a diffracted X-ray detector (38) for receiving the diffracted X-ray beam. Aperture elements (32, 36) are provided in front of the detectors (12, 38) for controlling the forward and diffracted beams incident on the detectors.
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