发明名称 |
MANUFACTURE OF SEMICONDUCTOR DEVICE HAVING SILICON FILM WITH DOME-SHAPED GRAINS |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device having a silicon film with dome-shaped grains which can be used as a capacitor electrode. SOLUTION: This method includes a step of forming an amorphous silicon film 11 doped with impurity by a PECVD(plasma enhanced chemical vapor deposition) method on a semiconductor substrate 1 at a low temperature of not higher than 400 deg.C and then patterning the film to form an amorphous silicon film pattern 5 doped with impurity. Then, the method includes a step of forming a silicon film 11 having dome-shaped grains on the surface of the amorphous silicon film pattern 5 doped with impurity. Thus, by forming a HSG-Si film 7 after forming the amorphous silicon film 11 doped with impurity by the PECVD method at a low temperature, a uniform HSG-Si film 7 can be formed. |
申请公布号 |
JPH1117120(A) |
申请公布日期 |
1999.01.22 |
申请号 |
JP19970354512 |
申请日期 |
1997.12.24 |
申请人 |
SAMSUNG ELECTRON CO LTD |
发明人 |
KIM YOUNG SUN;LEE SANG HYEOP;LEE SEUNG-HWAN;PARK YOUNG-WOOK;TAKAGI MIKIO |
分类号 |
H01L27/04;C23C16/24;H01L21/205;H01L21/822;H01L21/8242;H01L27/108 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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