| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide an X-ray diffraction microscope apparatus by which a large sample crystal can be tested without increasing the distance between the sample crystal and an X-ray source. SOLUTION: An X-ray diffraction microscope apparatus is provided with a plurality of X-ray sources 1, 18 as dotlike focuses and with a photographic plate 6 which is used to record diffraction X-rays on the crystal face of a sample crystal 4. Radiating X-ray beams which are generated from the respective X-ray sources are passed through a slit 3 which limits a beam width in the horizontal direction so as to irradiate the crystal face of the sample crystal 4, and the intensity distribution of the diffraction X-rays corresponding to the whole crystal face is recorded on the photographic plate 6. The radiating X-ray beams, from the respective X-ray sources, which are passed through the slit 3 are made continuous in the vertical direction on the crystal face of the sample crystal 4, and the whole crystal face of the sample crystal 4 is scanned by the beams.</p> |
