| 摘要 |
<p>The photo-sensor of integrated circuit type (P) has a network (R) of cells (. , Cn- 1,Cn, Cn+1,Cn+2,), each cell having a photo-sensitive component (PH) and a processing circuit (CE) connected to the component (PH) which enables transfer of the cells signal to a common output (SC) of the sensor, under the action of an addressing signal which permits selective and sequential connection of all the cells to the common output. The photo-sensitive component (PH) presents intrinsically a parasitic capacity (CP). Each cell has an integrated conducting region (RC) forming with the photo-sensitive component (PH) a test capacity (CPT) which is coupled to the parasitic capacity (CP). So that the photo-sensitive components (PH) can be tested in the dark each cell has device (H,CT,M) integrated on the chip (P) so that, in synchronism with the addressing signal. A test pulse can be applied to capacity (CPT) for each component. This test pulse causes transfer of a pre-determined charge quantity from the test capacity to the parasitic capacity of the component (PH). This pre-determined charge is equivalent to that which the parasitic capacity will be charged if the photo- sensor was lit at a pre-determined intensity. It thus produces at the common output in the place of the measured signal, a signal which represents the operation of the addressed cell.</p> |
