发明名称 Method for fabricating a semiconductor device
摘要 A semiconductor device comprising a dual polysilicon gate structure in which the P type polysilicon gate is connected with the N type polysilicon gate by a bilayer conductive wiring structure without any contact, thereby significantly contributing to high integration, and a method for fabricating the semiconductor device such that the production yield is improved.
申请公布号 GB2290167(B) 申请公布日期 1999.01.20
申请号 GB19950011673 申请日期 1995.06.08
申请人 * HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 JAE KAP * KIM
分类号 H01L23/522;B60N3/10;E05F5/00;H01L21/768;H01L21/8238;H01L23/528;H01L27/092;(IPC1-7):H01L21/283;H01L21/336 主分类号 H01L23/522
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