发明名称 Structure of contact end in contact probe
摘要 In a contact probe having an array of leads densely attached to a surface of an insulative film, pressure contact ends formed by one end portions of the leads being arranged in array along one end edge of the insulative film, a structure of a contact end in the contact probe being characterized in that the pressure contact ends are located on a surface of the one end edge portion of the insulative film, and a slot is formed in the one end edge portion of the insulative film such that the slot is open between adjacent the contact ends. <IMAGE>
申请公布号 EP0860702(A3) 申请公布日期 1999.01.20
申请号 EP19980301147 申请日期 1998.02.17
申请人 SOSHOTECH CO., LTD. 发明人 OKUNO, TOSHIO;KATAKAWA, HIROSHI;KOBASHI, NARUTOSHI;OKAMOTO, KENICHI
分类号 G01R1/073;G02F1/1345 主分类号 G01R1/073
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