发明名称 |
Structure of contact end in contact probe |
摘要 |
In a contact probe having an array of leads densely attached to a surface of an insulative film, pressure contact ends formed by one end portions of the leads being arranged in array along one end edge of the insulative film, a structure of a contact end in the contact probe being characterized in that the pressure contact ends are located on a surface of the one end edge portion of the insulative film, and a slot is formed in the one end edge portion of the insulative film such that the slot is open between adjacent the contact ends. <IMAGE> |
申请公布号 |
EP0860702(A3) |
申请公布日期 |
1999.01.20 |
申请号 |
EP19980301147 |
申请日期 |
1998.02.17 |
申请人 |
SOSHOTECH CO., LTD. |
发明人 |
OKUNO, TOSHIO;KATAKAWA, HIROSHI;KOBASHI, NARUTOSHI;OKAMOTO, KENICHI |
分类号 |
G01R1/073;G02F1/1345 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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