发明名称 Low RC interconnection
摘要 A low RC delay interconnection pattern is formed with a low resistivity metal, such as copper, and a low dielectric constant material, such as organic polymers. An intermediate bonding layer is formed between the low resistivity metal and low dielectric constant material employing an adhesion promoter, such as a silane-based adhesion promoter. The adhesion promoter can be applied between the metal and dielectric layers or incorporated in the dielectric layer.
申请公布号 US5861677(A) 申请公布日期 1999.01.19
申请号 US19970890905 申请日期 1997.07.10
申请人 ADVANCED MICRO DEVICES, INC. 发明人 YOU, LU;CHEUNG, ROBIN W.;CHAN, SIMON S.;HUANG, RICHARD J.
分类号 H01L21/3205;H01L21/312;H01L21/768;H01L23/31;H01L23/52;H01L23/522;H01L23/532;(IPC1-7):B29B13/00;B05D3/02;H01L21/283 主分类号 H01L21/3205
代理机构 代理人
主权项
地址