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发明名称
METHOD FOR DETECTING DEFECT
摘要
申请公布号
KR0159831(B1)
申请公布日期
1999.01.15
申请号
KR19950024607
申请日期
1995.08.09
申请人
RICOH CO., LTD.
发明人
PEAIRS, MARK;CULLEN, JOHN;JAMES, ALLEN;STORK, DAVID
分类号
H04N1/40;G06F11/00;G06K9/36;G06T1/00;G06T7/00;G06T7/20;H04N1/00;H04N1/409;H04N1/56;H04N17/00;(IPC1-7):H04N1/40
主分类号
H04N1/40
代理机构
代理人
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地址
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