发明名称 SURFACE INSPECTING METHOD AND SURFACE INSPECTING DEVICE
摘要 <p>A surface inspecting method and a surface inspecting device for inspecting a broad range of a surface to be inspected without increasing the size of the lenses of an object-side telecentric optical system. To inspect the surface of the object by observing the light reflected by the object through the object-side telecentric optical system or the image-side telecentric optical system, the optical axis of the object-side telecentric optical system or the image-side telecentric optical system is inclined with respect to the normal of the object.</p>
申请公布号 WO1999001751(P1) 申请公布日期 1999.01.14
申请号 JP1998002693 申请日期 1998.06.18
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