发明名称 |
ABLATION PROFILER |
摘要 |
A calibration system uses error data from an ablation profiler or from a topographer to adjust the operating parameters of a laser ablation system. An ablation profiler, useful in calibrating systems that perform vision correction by ablating corneal tissue, is based on a scanning white light interferometer (SWLI) system. The profiler measures a sample (14) of material that has been ablated and maps the contours of the sample (14) to compare it with a database of desired contours. The SWLI system includes a novel method of controlling the movement of the SWLI's reference surface (22) using an inexpensive electromagnet assembly with a capacitive feedback control system, a pin-hole light source to improve interference patterns, and off-axis positioning of the light source and camera to avoid specular reflections. The system also includes a method of preparing the transparent sample for measurement by applying a rear-surface opaque coating and using front-surface illumination. Alternately, samples can make use of roughened surfaces to provide the required optical properties.
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申请公布号 |
CA2294185(A1) |
申请公布日期 |
1999.01.14 |
申请号 |
CA19982294185 |
申请日期 |
1998.07.01 |
申请人 |
MACPHERSON, DAVID;DISHLER, JON G. |
发明人 |
MACPHERSON, DAVID;DISHLER, JON G. |
分类号 |
G01B9/02;G01B11/24;G01B11/255;(IPC1-7):G01B11/24 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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