| 摘要 |
PROBLEM TO BE SOLVED: To surely remove a contaminant sticking to the tip portion of a contact pin of a probe for electrical inspection of a base by one cleaning operation by utilizing a moving motion of the probe. SOLUTION: A conveying device 51 which conveys a base toward the downstream side sequentially, so that the surface of a base 30 whereon a component is mounted comes to the top for electrical inspection of the base and electrical inspection and jigs 10 and 11 which position the base and move a probe 4 for electrical inspection of the base so that the tip portion of a contact pin of the probe may come into direct contact with the surface of the base whereon the component is mounted, are provided. A moving motion of the tip portion of the contact pin is utilized so that a contaminant including a flux be caught surely in an elastic body sheet 100 by thrusting the tip portion of the contact pin into the sheet, and then the tip portion be extracted. |
