发明名称 Self-aligned process for making contacts to silicon substrates during the manufacture of integrated circuits therein
摘要 A process for forming vertical contacts in the manufacture of integrated circuits, and devices so manufactured. The process eliminates the need for precise mask alignment and allows the etch of the contact hole to be controlled independent of the etch of the interconnect trough. The process includes the steps of: forming an insulating layer on the surface of a substrate; forming an etch stop layer on the surface of the insulating layer; forming an opening in the etch stop layer; etching to a first depth through the opening in the etch stop layer and into the insulating layer to form an interconnect trough; forming a photoresist mask on the surface of the etch stop layer and in the trough; and continuing to etch through the insulating layer until reaching the surface of the substrate to form a contact hole. The above process may be repeated one or more times during the formation of multi-level metal integrated circuits.
申请公布号 US5858877(A) 申请公布日期 1999.01.12
申请号 US19970786482 申请日期 1997.01.21
申请人 MICRON TECHNOLOGY, INC. 发明人 DENNISON, CHARLES H.;DOAN, TRUNG T.
分类号 H01L21/768;(IPC1-7):H01L21/306 主分类号 H01L21/768
代理机构 代理人
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