发明名称 |
Annealing methods for forming isolation trenches |
摘要 |
A method for forming a microelectronic structure includes the steps of forming a mask layer on a substrate, forming a trench in the exposed portion of the substrate, forming a layer of an insulating material which fills the trench and covers the mask layer, and annealing the insulating material at a temperature of at least about 1,150 DEG C. The annealing step can be performed for a period of time of about .5 hours to about 8 hours, and the annealing step can be performed in an inert atmosphere.
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申请公布号 |
US5858858(A) |
申请公布日期 |
1999.01.12 |
申请号 |
US19960729453 |
申请日期 |
1996.10.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, TAI-SU;PARK, MOON-HAN;SHIN, YU-GYUN;LEE, HAN-SIN |
分类号 |
H01L21/76;H01L21/762;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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