发明名称 Annealing methods for forming isolation trenches
摘要 A method for forming a microelectronic structure includes the steps of forming a mask layer on a substrate, forming a trench in the exposed portion of the substrate, forming a layer of an insulating material which fills the trench and covers the mask layer, and annealing the insulating material at a temperature of at least about 1,150 DEG C. The annealing step can be performed for a period of time of about .5 hours to about 8 hours, and the annealing step can be performed in an inert atmosphere.
申请公布号 US5858858(A) 申请公布日期 1999.01.12
申请号 US19960729453 申请日期 1996.10.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, TAI-SU;PARK, MOON-HAN;SHIN, YU-GYUN;LEE, HAN-SIN
分类号 H01L21/76;H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/76
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