发明名称 |
Method of treating a semi-conductor wafer |
摘要 |
PCT No. PCT/GB95/01057 Sec. 371 Date Jan. 5, 1996 Sec. 102(e) Date Jan. 5, 1996 PCT Filed May 10, 1995 PCT Pub. No. WO95/31823 PCT Pub. Date Nov. 23, 1995In a method of treating a semi-conductor wafer a short-chain polymer is deposited on the wafer to planarise surface features on the wafer and a diffusion layer is deposited on the surface of the polymer layer to allow moisture to be released from the polymer at a controlled rate.
|
申请公布号 |
US5858880(A) |
申请公布日期 |
1999.01.12 |
申请号 |
US19960578660 |
申请日期 |
1996.01.05 |
申请人 |
TRIKON EQUIPMENT LIMITED |
发明人 |
DOBSON, CHRISTOPHER DAVID;KIERMASZ, ADRIAN |
分类号 |
H01L21/312;H01L21/316;(IPC1-7):B05D3/06 |
主分类号 |
H01L21/312 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|