X-RAY DIFFRACTION APPARATUS WITH LINEAR X-RAY DETECTOR

摘要

PROBLEM TO BE SOLVED: To provide an X-ray diffraction apparatus which enables freely selection of both of a sample limited measurement to be performed as for a specified sample with an X-ray counter fixed and a continuous high resolutions measurement to be performed with an view to obtain a continuous X-ray diffraction graphic by rotatively moving the X-ray counter in scanning. SOLUTION: This X-ray diffraction apparatus has a CCD X-ray detector 7 having a positional resolutions within a linear range and a detector function switching device 6. The function switching device 6 switches the following two positions of the CCD detector 7: the zero-dimensional measuring position P at which the range of detecting X rays is in the tangential direction of a Debye ring Q of diffraction X rays and the one-dimensional measuring position L at which the range of detecting X rays is in the radial direction of the Debye ring Q. The CCD detector 7 placed at the zero-dimensional measuring position P detects the intensity of X rays being turned by 2 and the detector 7 at the one-dimensional measuring position L detects the intensity of X rays by being fixed.