Method and apparatus for calibrating integrated circuit analog-to-digital converters

摘要

The calibration method comprises the steps of: driving the analog-to-digital converter (ADC) with at least one test signal; calibrating the driven ADC over a series of successive ADC calibrations; generating a series of successive ADC figure of merit measurements for respective successive ADC calibrations, the series of successive ADC figure of merit measurements defining at least a portion of a curve having a local minimum/maximum; and stopping calibrating at an ADC calibration corresponding to the local minimum/maximum of the curve defined by the series of successive ADC figure of merit measurements. The step of calibrating comprises incrementally calibrating the ADC over the series of successive ADC calibrations. The method comprises the step of determining the local minimum/maximum of the curve. The step of determining comprises fitting an equation to the series of ADC figure of merit measurements; and calculating the local minimum/maximum based upon the equation. The step of fitting the equation comprises fitting the equation based upon a predetermined number of prior ADC figure of merit measurements. The step of fitting the equation may comprise fitting a polynomial equation, such as a third order equation, to the series of ADC figure of merit measurements. <IMAGE>