发明名称 Interferometric method to measure phase difference between superimposed optical waves
摘要 The method involves feeding a signal wave (3) and at least one reference wave (4), which is coherent with respect to it, together. The waves are measured interferometrically and evaluated in common. The intensity of at least one part-beam coupled out of the signal or the reference waves is measured simultaneously with the interferometric measurement and evaluation. This enables the phase difference between the signal wave and the reference waves to be measured. For a nonlinear sensitivity of the detector, a correction value is calculated according to the sensitivity of the detector value of the part wave.
申请公布号 DE19726931(A1) 申请公布日期 1999.01.07
申请号 DE19971026931 申请日期 1997.06.25
申请人 FRIEDRICH-SCHILLER-UNIVERSITAET JENA, 07743 JENA, DE 发明人 CEDILNIK, GREGOR, DIPL.-PHYS., 07745 JENA, DE
分类号 G01J9/04;(IPC1-7):G01J9/04;G01B9/02 主分类号 G01J9/04
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