发明名称 EXPOSURE METHOD AND PHOTOMASK USED THEREFOR
摘要 PROBLEM TO BE SOLVED: To realize an oblique illumination technique without altering illumination system of an aligner. SOLUTION: A region of a second surface 13b opposite to a surface where a specified pattern 15 of a photomask 11 is formed, facing at least a light transmission part 15b in the specified pattern 15, is provided with a light diffracting pattern 17. The light diffracting pattern 17 is a pattern provided with one or more light-shielding parts 17a of the size, which is so selected as not to be resolved within at least a focus depth of the specified pattern 15. And exposure is performed through the photomask 11 provided with the light diffracting pattern 17.
申请公布号 JPH113847(A) 申请公布日期 1999.01.06
申请号 JP19970154053 申请日期 1997.06.11
申请人 MIYAZAKI OKI ELECTRIC CO LTD;OKI ELECTRIC IND CO LTD 发明人 TAZAKI YOSHIHIDE
分类号 G03F1/60;H01L21/027 主分类号 G03F1/60
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