发明名称 Method of making compound semiconductor device having a reduced resistance
摘要 A method for fabricating a semiconductor device includes a step of depositing a first compound semiconductor layer by a MOVPE process to have a first conductivity type, doping a surface of the first compound semiconductor layer to the same, first conductivity type, by implementing a planar doping process as a result of decomposition of a gaseous dopant, such that no substantial growth of the first compound semiconductor layer occurs during the planar doping process, and depositing a second compound semiconductor layer of the first conductivity type on the doped surface of the first compound semiconductor layer by a MOVPE process.
申请公布号 US5856209(A) 申请公布日期 1999.01.05
申请号 US19970821044 申请日期 1997.03.20
申请人 FUJITSU LIMITED 发明人 IMANISHI, KENJI
分类号 H01L29/73;H01L21/205;H01L21/331;H01L21/338;H01L29/205;H01L29/737;H01L29/778;H01L29/812;(IPC1-7):H01L21/20 主分类号 H01L29/73
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