发明名称 Method of depositing a smooth conformal aluminum film on a refractory metal nitride layer
摘要 A method of forming a conformal aluminum film on a refractory metal nitride layer is provided and includes positioning a substrate having the refractory metal nitride layer thereon within a chemical vapor deposition chamber; establishing a nominal temperature for the substrate; introducing a carrier gas containing a gaseous, metalorganic precursor into the chamber for a time sufficient to form a metallic seed layer; and introducing a carrier gas containing a gaseous aluminum metalorganic precursor into the chamber for a time sufficient to form a conformal aluminum metal film over the metal refractory nitride layer.
申请公布号 US5856236(A) 申请公布日期 1999.01.05
申请号 US19960663996 申请日期 1996.06.14
申请人 MICRON TECHNOLOGY, INC. 发明人 LAI, GILBERT;SANDHU, GURTEJ S.;IYER, RAVI;VAARTSTRA, BRIAN A.
分类号 C23C16/02;C23C16/44;H01L21/285;H01L21/768;(IPC1-7):H01L21/44 主分类号 C23C16/02
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