发明名称 DRY-ETCHING OF THIN FILM LAYERS
摘要 A reactive ion etch (RIE) technique includes providing a material layer to be etched and supplying a reactive gas to a vicinity of the material layer. A single electric field is supplied to react the reactive gas with the material layer so as to form volatile byproducts of reactive gas and the material layer. The electric field has a frequency in the range from approximately 1 megahertz (MHz) to approximately 11 megahertz (MHz), for example, approximately 2 MHz. Indium and tin oxides, as well as aluminum and aluminum alloys, are suitable as the material layer.
申请公布号 WO9859380(A1) 申请公布日期 1998.12.30
申请号 WO1998US13225 申请日期 1998.06.23
申请人 APPLIED KOMATSU TECHNOLOGY, INC. 发明人 CHEN, JIE;GOTO, HARUHIRO;KOLLRACK, MARC, MICHAEL;SORENSEN, CARL;WHITE, JOHN;WU, TZY-CHUNG;WONG, YUEN-KUI
分类号 G02F1/1343;H01L21/3213;H01L31/18;(IPC1-7):H01L31/18;H01L21/321 主分类号 G02F1/1343
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