RECORDING APPARATUS

摘要

A probe (1) and a recording medium (2) are placed close to each other in an atomic force microscope. While a predetermined repulsion (or a predetermined gap) is maintained between the probe and medium, an attraction (electrostatic force or push force) is applied between them so that the surface of the recording medium may suffer plastic deformation at room temperature to form a recess structure (3). Each recess in the surface forms a recording unit which is read to retrieve information. <IMAGE>