发明名称 Massively parallel detection
摘要 The invention provides apparatuses for detecting light from, for example, closely spaced detection sites. In one embodiment, the invention provides an apparatus for measuring the amount of light emitted from a first set of two or more detection sites on a planar substrate while spatially resolving the measurements from each first set detection site, the apparatus comprising: a source of a light beam directed towards the planar substrate at a first angle; one or more lenses for focusing light emitted or reflected from each of the first set detection sites and having a second angle having an angle offset from the first angle, onto a unique area of an array detector; and the array detector comprising a plurality of light responsive pixels, wherein for each first detection site there is at least one light responsive pixel that receives light emitted or reflected from that detection site and substantially no cross-talk from another detection site, and wherein substantially none of the light from the light source intersects with the array detector.
申请公布号 US5854684(A) 申请公布日期 1998.12.29
申请号 US19960721432 申请日期 1996.09.26
申请人 SARNOFF CORPORATION 发明人 STABILE, PAUL J.;LUDINGTON, DAVID NORMAN;YORK, PAMELA KAY;ROSEN, ARYE;CHERUKURI, SATYAM CHOUDARY;ZANZUCCHI, PETER JOHN;HEANEY, PAUL
分类号 B01L3/00;C40B60/14;G01N21/25;(IPC1-7):G01N21/00 主分类号 B01L3/00
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