发明名称 RExM1-xMnyO delta films for microbolometer-based IR focal plane arrays
摘要 Microbolometers can be made with a thin film composition of matter having a large temperature coefficient of resistance (TCR) as compared to the same material in the bulk form. The composition is a manganite of the formulaRExM1-xMnyO delta where RE is Y and the rare earths such as La, Ce, Pr, Nb, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, and combinations thereof, M is a divalent metal such as Ca, Sr, Ba, Pb, and combinations thereof, x is less than l, y is from about 0.75 to about 1.5, and delta is from about 2.5 to about 4.0. The microbolometer is made by applying a thin film of the composition on to a substrate such as SiNx and annealing the deposited film to remove inhomogeneities and to decrease the defects so as to increase the TCR.
申请公布号 US5854587(A) 申请公布日期 1998.12.29
申请号 US19970883037 申请日期 1997.06.26
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY 发明人 HORWITZ, JAMES;CHRISEY, DOUGLAS;CAULFIELD, JOHN T.;DORSEY, PAUL E.
分类号 G01J5/20;H01L31/09;(IPC1-7):H01C7/10 主分类号 G01J5/20
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