发明名称 Separate hole injection structure for improved reliability light emitting semiconductor devices
摘要 <p>The recombination-enhanced degradation of the p-type heterointerface active layer or confining layer, of a double heterostructure (DH) light-emitting semiconductor device can be minimized by using hole injection into an n-type DH from a remote p-type hole injection layer. The hole injection layer is designed to achieve an acceptable hole injection efficiency and minimize optical absorption. The doping level and the species are selected to accurately control the p-n junction position. &lt;IMAGE&gt;</p>
申请公布号 EP0886326(A2) 申请公布日期 1998.12.23
申请号 EP19980100853 申请日期 1998.01.19
申请人 HEWLETT-PACKARD COMPANY 发明人 STOCKMAN, STEPHEN A.
分类号 H01L33/00;H01L33/30;H01S5/30;H01S5/32;(IPC1-7):H01L33/00 主分类号 H01L33/00
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