发明名称 |
Packaged semiconductor device having stress absorbing film |
摘要 |
PURPOSE: To provide a technology, wherein reliability of a semiconductor device can be improved. CONSTITUTION: For a semiconductor device sealed up with a mold resin, an insulating tape 4 which electrically insulates an inner lead, comprising a common inner lead 3a2 and plural signal inner leads 3a1 from a semiconductor chip 1 is extruded by a slight amount above the common inner lead 3a2 and the signal inner lead 3a1 . An occurrence of crack on a sealing-up resin and occurrence of a void within a narrow space between the inner lead and the semiconductor chip are prevented, for improved reliability of a semiconductor device. |
申请公布号 |
SG55183(A1) |
申请公布日期 |
1998.12.21 |
申请号 |
SG19960009076 |
申请日期 |
1992.03.17 |
申请人 |
HITACHI, LTD.;TEXS INSTRUMENTS INCORPORATED |
发明人 |
CHONG CHAI TAI;EDWARDS DARVIN;ANJOH ICHIRO;ARITA JUNICHI;TSUBOSAKI KUNIHIRO;BENG LIM THIAM;ICHITANI MASAHIRO;AMAGAI MASAZUMI |
分类号 |
H01L23/50;H01L23/28;H01L23/29;H01L23/31;H01L23/495 |
主分类号 |
H01L23/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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