发明名称 CHARGE PUMP CIRCUIT FOR SEMICONDUCTOR MEMORY DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To output a booster voltage to an output node of a load without loss, which is created by operating a regulator, oscillator, high voltage detector section and charge pump by using a power supply voltage. SOLUTION: A controller 23 is driven by a high-level ON signal LON input from a regulator 22 and is triggered by the edge of a RAS bar RASB signal input from the external of a chip and then outputs a high-level RAS pulse signal PASP. When a high-level ON signal LON from the regulator 22 inputs, then an oscillator 24 outputs an oscillation pulse signal OSCH of a predetermined period. When the RAS pulse signal RASP and an oscillation pulse OSCH inputs, a charge pump 25 performs the pumping operation up to a desired booster voltage VPP and stops the pumping operation when a high-level high voltage detection signal HVDET from a high voltage detecting section 21 inputs. A pull-up transistor 26 turns the booster voltage VPP of initial power up into a potential VDD-Vt.</p>
申请公布号 JPH10337003(A) 申请公布日期 1998.12.18
申请号 JP19980090378 申请日期 1998.04.02
申请人 LG SEMICON CO LTD 发明人 KANG CHANG-MAN;JUN YOUNG-HYUN
分类号 G11C16/06;G05F3/26;G11C5/14;H02M3/07;(IPC1-7):H02M3/07 主分类号 G11C16/06
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