发明名称 MEMORY APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To reduce an access time without being influenced by a wiring resistance of a word line, by making a memory cell field effect transistor pull a current from a selected bit line by means of a selecting means for a first period and a second period. SOLUTION: A memory apparatus having a gate-grounded type memory sense amplifier comprises N-channel transistors T1-T12, P-channel transistors T21-T25, inverters I1, I2, a selector SL, a memory block MB, etc. The N-channel transistor T1 changes a potential of a node N1 in accordance with a size of a current to be pulled out from a node S of a gate-grounded amplifier type. The inverter I1 outputs 'L' or 'H' to a node 2 depending on whether the potential of the node N1 is larger than a predetermined value or not. The inverter I2, P-channel transistor T22 precharges one of bit lines B0-B3.</p>
申请公布号 JPH10334683(A) 申请公布日期 1998.12.18
申请号 JP19970138976 申请日期 1997.05.28
申请人 MITSUBISHI ELECTRIC CORP 发明人 NAKAMURA KAZUO
分类号 G11C11/419;G11C7/06;G11C17/12;(IPC1-7):G11C17/12 主分类号 G11C11/419
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