SEMICONDUCTOR STORAGE DEVICE, TEST APPARATUS, AND TEST METHOD

摘要

PROBLEM TO BE SOLVED: To monitor an internal environment and realize adjustment of a test environment in accordance with the monitored internal environment. SOLUTION: An environment detection circuit 2 of a semiconductor storage device 100 receives power supply from an internal power generating circuit 1 and detects an internal environment (temperature). A switch 3 outputs to an external output pin 4 environment data corresponding to the detected temperature in accordance with a control signalϕ. A control section 6 of a test apparatus 200 receives environment data obtained before the start of test, compares it with previous environment data (stored in a storing section 7), and then executes control for conducting (or stopping) an adjusting test or conducting a re-test.