发明名称 PLASMA PROCESSING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a plasma processing device, which increases the radical generating efficiency and which can perform the processing at a high speed, by supplying the gas from a central part of a processing chamber toward a plasma generating area. SOLUTION: The gas 16 from a gas supplying port 4 is passed through a flow passage 17 inside a baffle plate 15, and led into a plasma 11 through a gas lead-in port 18 provided in a central part of the baffle plate 15. The gas 16 flows inside a plasma generating area from a central part of a processing chamber 1 to the peripheral part, and passes through distribution holes 19 of the baffle plate 15, and is discharged from a vacuum discharge port 3. With this structure, since almost of the gas 16 passes through inside the plasma generating area, radical can be efficiently generated. As a result, a material 12 to be processed can be processed for ashing at a high processing speed. In the case where a space between a quartz window 2 and the baffle plate 15 is reduced to a degree that the plasma 11 contacts with the baffle plate 15, almost of the gas 16 passes through the plasma 11 generating area and radical can be most efficiently generated.
申请公布号 JPH10335094(A) 申请公布日期 1998.12.18
申请号 JP19970139637 申请日期 1997.05.29
申请人 HITACHI LTD 发明人 WATANABE SEIICHI;KADOYA AKIHIRO;TAKAHASHI NUSHITO;KAWAHARA HIROYOSHI
分类号 H05H1/46;G03F7/42;H01L21/027;H01L21/302;H01L21/3065;(IPC1-7):H05H1/46;H01L21/306 主分类号 H05H1/46
代理机构 代理人
主权项
地址