发明名称 SEMICONDUCTOR DETECTOR
摘要 PROBLEM TO BE SOLVED: To improve energy dissolution, by forming a semiconductor element, which generates a pair of electron holes by X ray incidence, by using black phosphorus. SOLUTION: A semiconductor element 1 is formed of black phosphorus single crystal, and a pin-type structure that includes a p-layer close to the front plane (X ray incidence plane), an n-layer close to the rear plane and an i-layer, i.e., an intrinsic region, between the both layers, is formed. Black phosphorus has an approximately 1/4 band gap compared with that of silicon and is known as a narrow band gap semiconductor. FluctuationΔEd is in proportion toεto the 1/2 power, whereεis an energy generated by a pair of electron holes. When a Fano factor does not change, the fluctuationΔEd of black phosphorus becomes approximately 1/2, compared with that of silicon. The amplitude of a signal obtained from a semiconductor element is in proportion to the energyε. Therefore, when the electric noise is fixed, theΔEp becomes approximately 1/4. As the fluctuationsΔEd andΔEp become smaller than those of silicon, the energy disolution of the entire measurement system can be improved.
申请公布号 JPH10335691(A) 申请公布日期 1998.12.18
申请号 JP19970142582 申请日期 1997.05.30
申请人 TECHNOS KENKYUSHO:KK 发明人 TERADA SHINICHI
分类号 H01L31/09;(IPC1-7):H01L31/09 主分类号 H01L31/09
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