发明名称 Structured metal layer production especially on MOS structure
摘要 Production of a semiconductor structure with a structured metal layer (9) is carried out by (a) coating a region of the structure surface with a layer (7) of material having low adhesion to the metal; (b) forming, on the layer (7), spaced structure elements (8) of material having high adhesion to the metal; and (c) applying the metal layer (9) so that it only remains adhering to the structure elements (8) and the layer (7) between the structure elements due to the ratio of the metal layer thickness 'd' to the structure element spacing 'a' and the metal properties. The metal layer (9) is preferably applied by electroless plating or by vapour deposition especially of palladium, followed by selective ultrasonic removal. Preferably, a MOS transistor is formed on the semiconductor structure and the layer (7) is a gate insulation layer on which a polysilicon layer is applied to form spaced gate electrodes, corresponding to the structure elements (8).
申请公布号 DE19724595(A1) 申请公布日期 1998.12.17
申请号 DE1997124595 申请日期 1997.06.11
申请人 MICRONAS SEMICONDUCTOR HOLDING AG, ZUERICH, CH 发明人 IGEL, GUENTER, DIPL.-ING., 79331 TENINGEN, DE
分类号 G01N33/00;H01L21/3205;H01L21/768;H01L23/532;(IPC1-7):H01L21/320;H01L21/285 主分类号 G01N33/00
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