发明名称 |
Detecting and analysing submicron particles |
摘要 |
A system for the single particle detection of submicron structures such as biological molecules and viruses utilises an optically transparent substrate 1 coated with a thin film of metal 2 illuminated with an optical beam 3 incident at or close to critical or SPR angle. Part of the beam propagates along the metal surface exciting plasmons in the metal film. These plasmons define a measurement zone from which submicron particles 6 contained in a sample placed in contact with the metal film scatter light. This scattered light is detected 9 in the far field at a normal or high angle to the plane of the metal film 2. The apparatus can be configured in a flow cytometric or optical microscope configuration.
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申请公布号 |
GB2326229(A) |
申请公布日期 |
1998.12.16 |
申请号 |
GB19970012202 |
申请日期 |
1997.06.13 |
申请人 |
ROBERT JEFFREY GEDDES * CARR |
发明人 |
ROBERT JEFFREY GEDDES * CARR |
分类号 |
G01N15/02;G01N15/14;G01N21/55;(IPC1-7):G01N21/55 |
主分类号 |
G01N15/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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