发明名称 Detecting and analysing submicron particles
摘要 A system for the single particle detection of submicron structures such as biological molecules and viruses utilises an optically transparent substrate 1 coated with a thin film of metal 2 illuminated with an optical beam 3 incident at or close to critical or SPR angle. Part of the beam propagates along the metal surface exciting plasmons in the metal film. These plasmons define a measurement zone from which submicron particles 6 contained in a sample placed in contact with the metal film scatter light. This scattered light is detected 9 in the far field at a normal or high angle to the plane of the metal film 2. The apparatus can be configured in a flow cytometric or optical microscope configuration.
申请公布号 GB2326229(A) 申请公布日期 1998.12.16
申请号 GB19970012202 申请日期 1997.06.13
申请人 ROBERT JEFFREY GEDDES * CARR 发明人 ROBERT JEFFREY GEDDES * CARR
分类号 G01N15/02;G01N15/14;G01N21/55;(IPC1-7):G01N21/55 主分类号 G01N15/02
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