发明名称 |
Conductive micro-probe and memory device |
摘要 |
<p>A micro-probe that has little deformation and wear while maintaining a desired conductivity is composed of a cylindrical wear resistant material and a conductive material. The wear resistant material provides mechanical contact with a contact target, while the conductive material provides an electrical contact with the contact target. The invention thus provides an ultra-small micro-probe having a long useful life, and that experiences little deformation or wear while maintaining the desired conductivity. <IMAGE></p> |
申请公布号 |
EP0884557(A2) |
申请公布日期 |
1998.12.16 |
申请号 |
EP19980110219 |
申请日期 |
1998.06.04 |
申请人 |
HEWLETT-PACKARD COMPANY |
发明人 |
GIBSON, GARY;YAGI, TAKAAKI |
分类号 |
B82B3/00;G01B7/34;G01N37/00;G01Q60/38;G01Q70/14;G01R1/06;G11B5/02;G11B9/00;(IPC1-7):G01B7/34 |
主分类号 |
B82B3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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