Semiconductor memory device capable of multiple word-line selection and method of testing same

摘要

A semiconductor memory device capable of conducting test operations includes a plurality of word drivers (34) which keep word lines (WL1 through WLn) in an active state when the word drivers (34) are selected until the word drivers (34) are reset. The semiconductor memory device further includes a control circuit (31, 32) which successively selects more than one of the plurality of word drivers (34) so as to achieve simultaneous activation of word lines (WL1 through WLn) corresponding to selected ones of the plurality of word drivers (34) during the test operations. <IMAGE>