发明名称 Method of passivating semiconductor wafers
摘要 A method of passivating an outer portion of a semiconductor wafer comprises: a) applying and patterning a metal layer to define conductive metal runners projecting atop the wafer, the conductive metal runners projecting outwardly from the wafer at given distances; b) applying an insulating dielectric layer atop the wafer to a thickness which is greater than the given distance of a furthest projecting metal runner; c) global planarizing the insulating dielectric layer to some point on the wafer which is elevationally above the underlying conductive metal runners; the preferred method is by chemical mechanical polishing; and d) applying a planar layer of an effective mechanical protection, chemical diffusion barrier and moisture barrier material atop the globally planarized layer of insulating dielectric.
申请公布号 US5849632(A) 申请公布日期 1998.12.15
申请号 US19920918930 申请日期 1992.07.22
申请人 MICRON TECHNOLOGY, INC. 发明人 TUTTLE, MARK E.;DOAN, TRUNG TRI
分类号 H01L21/318;H01L21/56;H01L23/00;H01L23/29;H01L23/31;(IPC1-7):H01L21/316 主分类号 H01L21/318
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