发明名称 |
Method of passivating semiconductor wafers |
摘要 |
A method of passivating an outer portion of a semiconductor wafer comprises: a) applying and patterning a metal layer to define conductive metal runners projecting atop the wafer, the conductive metal runners projecting outwardly from the wafer at given distances; b) applying an insulating dielectric layer atop the wafer to a thickness which is greater than the given distance of a furthest projecting metal runner; c) global planarizing the insulating dielectric layer to some point on the wafer which is elevationally above the underlying conductive metal runners; the preferred method is by chemical mechanical polishing; and d) applying a planar layer of an effective mechanical protection, chemical diffusion barrier and moisture barrier material atop the globally planarized layer of insulating dielectric.
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申请公布号 |
US5849632(A) |
申请公布日期 |
1998.12.15 |
申请号 |
US19920918930 |
申请日期 |
1992.07.22 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
TUTTLE, MARK E.;DOAN, TRUNG TRI |
分类号 |
H01L21/318;H01L21/56;H01L23/00;H01L23/29;H01L23/31;(IPC1-7):H01L21/316 |
主分类号 |
H01L21/318 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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