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发明名称
SEMICONDUCTOR WAFER PATTERN PHOTOGRAPHING MICROSCOPE
摘要
申请公布号
KR0126547(Y1)
申请公布日期
1998.12.15
申请号
KR19920024650U
申请日期
1992.12.08
申请人
HYUNDAI ELECTRONICS IND. CO.,LTD
发明人
LEE, HEE-MOOK;OH, YONG-KYUN
分类号
G02B21/00;(IPC1-7):G02B21/00
主分类号
G02B21/00
代理机构
代理人
主权项
地址
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