发明名称 |
Baking of photoresist on wafers |
摘要 |
A method and apparatus for curing a photoresist that is deposited in liquid form and spun on a surface of a wafer leaving a thin film to be cured. This invention teaches methods for curing the resist with improved thickness control using front side heating.
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申请公布号 |
US5849582(A) |
申请公布日期 |
1998.12.15 |
申请号 |
US19970847224 |
申请日期 |
1997.05.01 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
CHEN, CHAO-CHEN;CHIU, WEI-KAY |
分类号 |
G03F7/40;(IPC1-7):G03C5/00 |
主分类号 |
G03F7/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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