METHOD FOR PARALLEL ANALOG AND DIGITAL CIRCUIT FAULT SIMULATION AND TEST SET SPECIFICATION

摘要

In the method for constructing a fault dictionary, a description of the circuit is first made. A list of faults is extracted from this description of the circuit, and a fault-free circuit distribution of an output parameter of the circuit is calculated in response to the circuit description. A faulty circuit distribution of the output parameter is calculated in response to the faults of the list, and a fault value is calculated from the fault-free and faulty circuit distributions. The calculated fault value is stored in the fault dictionary in view of subsequently specifying a test vector for application to the circuit in view of testing this circuit. To specify test vectors in view of testing a given circuit, (a) a set of stimuli is first selected and then (b) a stimulus of this set is selected, (c) a fault from a list of faults of the circuit is selected, (d) a fault value related to the selected fault and stimulus is found in a fault dictionary, (e) the fault value found in step (d) is compared to a typical fault value, (f) whether the selected fault is detected or undetected by applying the selected stimulus to the circuit including the selected fault is determined in accordance with the result of the comparison of step (e), (g) steps (b, c, d, e and f) are repeated for each pair of stimulus and fault; and (h) test vectors are built from the stimuli of the set most susceptible to detect faults in the circuit.