发明名称 Semiconductor thin film useful for TFT
摘要 A novel semiconductor thin film consists of contiguous (flat) rod-shaped crystals, in which (i) the surface alignment is the same as the (110) alignment and almost all the crystal lattices exhibit continuity at each crystal boundary; (ii) the surface alignment is roughly the same as the (110) alignment and almost all the detectable crystal lattice edges linearly and continuously intersect each grain boundary of different crystal grains; (iii) the (110) alignment ratio is 0.9 or more and almost all the crystal lattices exhibit continuity at all the crystal boundaries; or (iv) the (110) alignment ratio is 0.9 or more and almost all the detectable crystal lattice edges linearly and continuously intersect each grain boundary of different crystal grains. Also claimed are semiconductor devices with insulated gates, in which at least one channel-forming region is formed from the semiconductor thin film described above.
申请公布号 DE19825081(A1) 申请公布日期 1998.12.10
申请号 DE1998125081 申请日期 1998.06.04
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD., ATSUGI, KANAGAWA, JP 发明人 OHTANI, HISASHI, ATSUGI, KANAGAWA, JP;YAMAZAKI, SHUNPEI, ATSUGI, KANAGAWA, JP;KOYAMA, JUN, ATSUGI, KANAGAWA, JP;OGATA, YASUSHI, ATSUGI, KANAGAWA, JP;MIYANAGA, AKISHARU, ATSUGI, KANAGAWA, JP
分类号 H01L21/20;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/04;H01L29/786;(IPC1-7):H01L29/04;H01L29/36 主分类号 H01L21/20
代理机构 代理人
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