Method for performing semiconductor component test system

摘要

The method involves executing an instruction of a test program, which yields an operation value. The operation value can then be stored in a data area. A further instruction is delivered to the test program to initiate an operation test. The operation test reads in the stored operation value and makes a corresponding circuit connection, which enables an operation test to be made. The test circuit connected may be a flank cycle generator. The operation value may comprise data which generates a cycle in which a flank impulse is included.