MANUFACTURE OF MEMORY CIRCUIT AND INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To replace more troubled cells with a few spare rows in a memory integrated circuit. SOLUTION: A memory circuit 200 comprises a main data memory array 220, an error memory array 240 and a spare memory array 230 which has spare rows for the replacement of troubled memory cells. Address information for the identification of the troubled memory cells is stored in the error memory array 240. The data memory array 220, the spare memory array 230 and the error memory array 240 are accessed simultaneously. The output of the error memory array 240 cuts off the rows of the troubled cells selectively and the spare rows in the spare memory array 230 are used for the connection to a data bus connected to an output data bus 261. The data memory array 220, the error memory array 240 and the spare memory array 230 operate synchronously with each other.