发明名称 TEST DATA COMPARISON SYSTEM
摘要 PROBLEM TO BE SOLVED: To simplify comparison processing and to shorten the comparison time by comparing and collating only necessary parts when a range of comparison and collation is small even if collected data become large in quantity. SOLUTION: An address storage part 17 stores address information supplied from a control part 16 and supplies address information to two buffers which are data storage parts 12 and 13. A data collection part 11 distributes and transfers the collected test data to the data storage parts 12 and 13 alternately by periods. The data storage parts 12 and 13 store only input data at positions specified with the address information, and read the stored data out and send them to a comparison part 14. The comparison part 14 compares the two inputted data with each other and supplies the comparison result to a comparison storage part 15.
申请公布号 JPH10320425(A) 申请公布日期 1998.12.04
申请号 JP19970130585 申请日期 1997.05.21
申请人 NEC ENG LTD 发明人 YANAGAWA YOSHIKATSU;SATO SHINJI
分类号 G06F11/22;G06F17/40;H04Q9/00 主分类号 G06F11/22
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